Some Difficulties and Status in the Application of X-Ray Spectrometry in Geological Analysis: A Review
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摘要:
X射线荧光光谱法(XRF)具有无损、快速、环保和分析精度高等特点，常作为地质样品中主量和微量元素分析的首选方法。然而，由于地质样品的矿物组成、物理结构特征(如尺寸、形状和分层等)和化学成分(如元素组成、化学形态等)的复杂性与多样性，XRF在地质样品分析的实际应用中存在一些技术难点。本文从小样品量和珍贵样品的分析、XRF的散射效应的应用、易挥发元素分析、变价元素分析和稀有金属分析等方面，对XRF在地质分析中的难点进行了总结与评述。指出制备易于保存和便于反复测量的小尺寸样片是小样品量和珍贵样品XRF分析的合适方法；XRF散射效应可用于成分未知的样品中更多化学成分信息的获取以及异质性样品原位分析误差的校正；超细粉末制样、稳定剂的加入和标准加入法建立工作曲线是解决易挥发元素XRF分析困难的方法。认为元素的特征X射线相对强度可用于变价元素价态和形态的分析；优化校准曲线、降低熔融制样的稀释比、高压激发和改善谱线重叠干扰是解决稀有金属分析困难的有效途径。
Abstract:X-ray fluorescence spectrometry (XRF) has become one of the widely used methods for main and trace elements analysis in geological samples, due to its characteristics of non-destructive, fast, environmentally-friendly and high analytical precision. Currently, XRF can qualitatively and quantitatively analyze most of the major and trace elements (4Be−92U, especially 10Na−92U) with the concentration ranges from μg/g to percent. However, there are still some difficulties in practical analysis of geological samples with XRF due to the complexity and diversity of mineral composition, physical structural characteristics (e.g. size, shape, delamination and inclusions) and chemical composition (e.g. elemental composition, chemical morphology) of geological samples. This paper elaborates difficulties and corresponding possible solutions of XRF analysis in geological samples from five aspects including small size samples or precious samples analysis, the application of scattering effect, the analysis of volatile elements, variable valence elements and rare metals. Finally, the limitations and challenges of the XRF technique that still exist in the geological analysis are presented. The BRIEF REPORT is available for this paper at
http://www.ykcs.ac.cn/en/article/doi/10.15898/j.ykcs.202403150052 . -
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图 1 (a)制备微玻璃珠试样时，将混合粉末放置在Pt-Au坩埚中的工艺原理图；(b)用硅胶聚合物黏合剂将微玻璃珠(直径约3.5mm)安装在直径35mm的空白玻璃片上；(c)附着在35mm空白玻璃片上的微玻璃珠的两个表面：(1)平面；(2)半球面。修改自文献［16］
Figure 1.
图 2 在45kV，用多毛细管X射线光学仪器在散射角为155.5°的几何结构下，用Rh靶X射线管激发获得的康普顿散射与瑞利散射强度比(ICo/IRa)与平均原子序数(Z)的校准曲线。修改自文献［19］
Figure 2.
图 3 在相同的实验条件下测量了两种托帕石晶体的XRF光谱(a)。为了更好地呈现散射线的细节，将17keV到23keV的区域(b)放大显示，对应托帕石2的谱线平移到更高能量0.3keV处。修改自文献［19］
Figure 3.
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